Mold Residue Cleaner

An important technology in semiconductor prodction,
this method clears various foreing substances
or contaminants from the surface of semiconductor Wafers.

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Mold Residue Cleaner

By removing diverse foreing materials and contaminants, the technology ensures a pristine surface,
thus securing the precision and reliability of semiconducotr components, and plays a crucial role
in enhancing the quality of the final products.

Laser Removing

Target: Metallic Residue, Foreign Matter, Organic Matter
Residue

Principle: Physical/Thermal Processing of Focused Laser

All-Surface Scan Processing to Minimize Wafer/Bump
Damage

Scan Processing of Recognition of Residue/Foreign
Matter Defect Areas

Point Matching and Processing of Foreign Matters

Wafer Bump Inspection

Residue Cleaning

Target: Organic Matter Residue, Byproduct of Laser
Processing

Principle : Physical Collision, Thermal Collision
Shrinkage/Expansion

Physical Collision and Breakaway between Particles and Compressed Air

Rapid Cooling(-70 ~ 80 ℃) for Shrinking Deformation

800x Expansion of CO2 Particle to Destruct
Contaminants

Vaporize Directly at Room Temperature and
No Secondary Contamination

Wafer LASER Cleaning

Blowing & Suction

Target: Byproduct of Processing, Floating Matter, Gas

Principle : Floating Matter/Gas Flow

Flow Occurrence of Anisotropic Blowing Floating Matter

Isotropic Suction for Preventing Secondary
Contamination

Wafer LASER Cleaning